Thin films deposition monitor AOS-4S (Ref.No. VPOL- aosS) and AOS-4Sir (Ref.No. VPOL-aosSir)
Desk-top spectrophotometer AOS-4SL ( Ref.No.VPOL- aosL)
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The AOS-4S acoustooptic spectrophotometer is designed both as desk top
spectrophotometer AOS-4SL and as optical thin films deposition optical
monitors AOS-4S and AOS-4Sir.
The main purpose of the device is to realize high-efficient method of
optical coating run spectrum monitoring in real time. It is achieved by
measuring reflectance or transmittance of the coating at high-speed wavelength
scanning within a fixed spectrum region. In so doing, most detailed on-line
information on a coating of an arbitrary type can be obtained at any moment
of the production run. The spectrophotometer also allows to use some operation
modes with a fixed wavelength:single-wave extremum monitoring for quarterwave coating,
single-wave level monitoring, and two-wave merit function monitoring.
The device can also be used as a desk-top spectrophotometer for lab and
industrial applications. Main advantages of the spectrophotometer are as
follows:
- high-speed scanning within a wide spectrum range;
- high precision and sensitivity of the photometric procedure;
- absolute wavelength setting without preliminary calibration;
- efficient noise suppression.
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AOS-4S thin films deposition optical monitor
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The AOS-4S acoustooptic spectrophotometer consists of:
- acoustooptic monochromator comprising tunable acoustooptic filters and
photodetectors;
- control unit that produces radio-frequency voltage to control the wavelength
tuning, performs the initial processing of the recorded signal and supports
interface with the control computer.
The spectrophotometer operates only under the control of an IBM PC
compatible computer using MS DOS or Windows operating systems. Software is an
integral part of the spectrophotometer, it sets a spectrophotometer operation
mode, controls wavelength tuning, processes the recorded signal, calculates
coating characteristics, represents experimental and calculated data on the
display and aaves them on a appropriate media.
These devices have some advantages by comparison with classic gratings
spectrophotometers. These advantages are essential for the device to be used in
deposition system. They are as follows:
- electronic frequency scanning is practically inertialess;
- signal modulation can be performed by RF-signal modulation and thus there is no need in mechanical modulators;
- the acoustooptic filter is a non-slit device, and this fact facilitates its matching with light sources and optical components of the vacuum chamber and provides larger illumination.
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| Spectral range, nm
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370-1175
370-1175
400-1650 |
Spectral bandwidth, nm, no worse than:
- at 408 nm wavelength:
- at 633 nm wavelength:
- at 1014 nm wavelength:
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0.4
0.6
2 |
| Minimum step of wavelength tuning, nm, no more than |
0.1 |
Wavelength accuracy, nm:
- at 370...720 nm range:
- at 720...1175 nm range:
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±0.4
±1 |
| Number of spectral points in a fixed spectrum range |
2 ... 201 |
| Minimal spectral point measurement time, ms |
5 |
| Typical spectral point measurement time, ms |
40 |
Photometric accuracy:
- reflectance (R in %): at 400...1100 nm range:
- transmittance (T in %): at 400...1100 nm range:
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±(0,2 + 0,02R)%
±(0,2 + 0,01T)% |
| Computer compatibility |
RS232 |
| Power supply |
190...245 V, 50 Hz |
| Power consumption (except computer), VA, no more than |
500 |
Overall dimensions, mm:
- monochromator:
- control unit:
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150x425x85
375x480x188 |
Weight, kg:
- monochromator:
- control unit:
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2.5
12 |