CENTAUR HR^TM - Scanning Raman/SPM Device with Ultra High Spectral Resolution

CENTAUR HR^TM (High Resolution) includes high-aperture double dispersive monochromator/spectrograph whose compact design combines high spectral resolution intrinsic for long-focus devices and extremely low stray light peculiar to double schemes. It is possible to measure Raman lines up to 20 cm^-1 from excitation line with spectral resolution up to 0.01 nm which is different to the devices based on interferometric filters with typical values of 100-200 cm^-1. It is also possible to observe Stocks and Anti-Stocks lines simultaneously.

CENTAUR HRTM combines: Scanning Probe Microscope; Upright or Inverted Optical Microscope; Laser Confocal Microscope; Raman Confocal Microscope; Fluorescence Confocal Microscope.

Applications: Scanning Probe Microscopy; Raman Confocal Microscopy; Fluorescence Confocal Microscopy; Near-Field Scanning Microscopy; Tip-Enhanced Raman Spectroscopy (TERS); Tip-Enhanced Fluorescent Spectroscopy (TEFS).

Where to use:

• Chemistry. Combination of Scanning Probe Microscopy and Raman Spectroscopy methods allows analyze organic and inorganic substances composition and structure, traditional and composite materials;
• Physics. Investigations of substances and materials surface and subsurface layers physical characteristics;
• Biology. Study of tissues, cells and their structures, biological molecules and the interactions between them;
• Interdisciplinary researh. Researches in the fields of nanotechnology, pharmaceuticals, material sciences, mineralogy, geology, forensic, analysis of art and many others.

Click on the pictures below to magnify them:

CENTAUR HR^TM advantages:

• Dual independent scanners (in the head and in the base);
• Multiply simultaneous signal recording (confocal, spectra, topography, phase, etc.);
• Full spectra recording in each scan point with high spectral resolution;
• Integration with virtually unmodified upright or inverted optical microscopes to work with transparent and none transparent samples;
• Modern cross-platform software for all the CENTAUR^TM units.

Components:

• Scanning Probe Microscope CERTUS^TM;
• XY sample piezo scanning stage RATIS^TM;
• Confocal unit;
• Monochromator with high spectral resolution;
• Optical microscope (upright or inverted);
• Digital controller EG-3000^TM;
• Software NSpec^TM.

Demonstration of obtaining spectral information from surface, containing objects with different emission spectra (emulator mode)



Demonstration of obtaining spectral information from test silicon lattice




Contact us for more detailed information!

Download complete SPM Catalog

VECOR 101 Duranzo Aisle, Irvine, CA92606, USA
Phone: +1-949-394-4466, Fax: +1-949-451-6813, info@vecorus.com