CERTUS LIGHT^TM - Entry Level Scanning Probe Microscope (SPM)

	CERTUS LIGHTTM System includes: Scanning head CERTUSTM Digital SPM controller EG-300TM NSpec software package Head approach system with one motorized actuator Simple stand for a sample and SPM head.
CERTUS LIGHTTM features: Support of all bascic SPM techniques: Atomic Force Microscopy (AFM, contact, and non-contact), shear force AFM, force spectroscopy, Scanning Tunneling Microscopy (STM), etc.; Plane-parallel scanning (in X-Y plane) allows imaging with minimal distortion; Open design of scanning head simplifies observation of a sample and probe at any angle from 0o to 90o; CERTUS LIGHTTM is suitable for installation on optical microscope (upright or inverted) and can also be modified to CERTUS STANDARDTM, CERTUS OPTICSTM, and CENTAURTM.
Single-walled nanotube deposited on mica. Image was obtained with scanning probe microscope CERTUS LIGHTTM. Image size 2.2 mcm x 2mcm. 200 x 200 points. Phase image.

SPM head CERTUSTM contains several probe holders: for standard cantilevers, for "tuning fork" type SPM probes with horizontal and vertical orientation, for STM tips. Any custom design tip holders may be developed by our R&D team by customer request. One has to change tip holder to change SPM mode. It is convenient to have several tip holders for use SPM head in cleaned areas, boxes. In this case, only tip holders are being transferred though transition chambers and hatches. You don’t need to move head (SPM microscope).

Reasonable price and reliable CERTUS LIGHT^TM design make it a valid choice for teaching purposes and time-to-time research tasks. CERTUS LIGHT^TM could also be interesting for those who have an idea to add SPM functionality to their existing experimental setup.

Unique "open design" allows you use extremal large aperture objectives, illuminators, microscope condensers, etc. to illuminate the work area, monitor the sample and the probe position, take stock of radiation in the point of probe and sample contact.

SPECIFICATIONS

SPM Head
Built-in XYZ scanner
Scanning/positioning XYZ range, mcm	100x100x15
XY stage resonant frequency, kHz	1
Z resonant frequency, kHz	7
SPM resolution (XY lateral), nm	<1
SPM resolution (Z vertical), nm	<0.1
Residual non-linearity	0.3%
Displacement sensor
Sensor type	Capacitance
Measuring principle	Time-to-digital convertion
Scanning head approach system
Coarse approach implementation	1 stepper motor and 2 precision screws
Sample positioning	Manual

Contact us for more detailed information!

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VECOR 101 Duranzo Aisle, Irvine, CA92606, USA
Phone: +1-949-394-4466, Fax: +1-949-451-6813, info@vecorus.com