CERTUS OPTICS - Integrated Optical and Scanning Probe Microscopes

	CERTUS OPTICS includes: Scanning head CERTUS; XY-scanning stage RATIS; Optical microscope (upright or inverted); Integrated mechanical XY stage for sample adjustment; SPM controller EG-3000 NSpec software package;
CERTUS OPTICS Advantages: Scanning stage RATIS can position the sample with sub-nanometer accuracy; Two scanning modes: XY sample scanning with the stage and Z scanning with the head scanner, or XYZ scanning with the head scanner; Plane-parallel scanners in the head and base allow measurements without distortion typical for tube scanners; Both transparent and non-transparent samples may be investigated (depending on the microscope type); Optical microscope makes it possible to use all conventional sample observation techniques. So one can easily find appropriate area on the sample and position the tip over it. CERTUS OPTICS may be equipped with brand new microscope or adopted for the customer one; Independent systems of sample and probe positioning provide a possibility to put the sample in the middle of field of view and install the probe over it; CERTUS OPTICS may be integrated with spectroscopic devices and upgraded to CENTAUR or CENTAUR HR. CERUS OPTICS is indispensable tool to study surface physical and chemical properties in such areas as:
	Chemistry; Physics; Biology; Interdisciplinary researches. Advanced applications: Coatings; Polymers (including liquid crystals and composites); Semiconductors; Biological objects (especially in combination with fluorescent microscopy); MEMS and other electronic components.

In addition, parts of CERTUS OPTICS may be possibly used as an independed research equipment:

• RATIS - samples positioning in XY plane with an accuracy of a few parts of nanometer;
• CERTUS (version - CERTUS STANDARD) - a scanning probe microscope to study surface physical and chemical properties;
• Optical microscope - for non-SPM microscopic studies.

CERTUS OPTICS may be easily upgraded to our CENTAUR HR SPM Confocal Specroscopy system.

CERTUS OPTICS is an essential part of any experimental setup for TERS/FRET effects investigation.

CERTUS OPTICS idea:

• High resolution optical microscope allows easy object detection;
• Scanning probe microscope allows obtain object 3D image;
• Samples may be studied being in native state.

SPM head CERTUS contains several probe holders: for standard cantilevers, for "tuning fork" type SPM probes with horizontal and vertical orientation, for STM tips. Any custom design tip holders may be developed by our R&D team by customer request. One has to change tip holder to change SPM mode. It is convenient to have several tip holders for use SPM head in cleaned areas, boxes. In this case, only tip holders are being transferred though transition chambers and hatches. You don’t need to move head (SPM microscope).

SPECIFICATIONS

SPM Head
Built-in XYZ scanner
Scanning/positioning XYZ range, mcm	100x100x15
XY stage resonant frequency, kHz	1
Z resonant frequency, kHz	7
SPM resolution (XY lateral), nm	<1
SPM resolution (Z vertical), nm	<0.1
Residual non-linearity	0.3%
Displacement sensors
Sensors type	Capacitance
Measuring principle	Time-to-digital convertion
Scanning head approach system
Minimum step, mcm	1
Coarse approach implementation	3 stepper motors
Scanning basement
Built-in XY plain-parallel stage
XY scanning range, mcm	100x100
XY resonant frequency, kHz	1
Residual nonlinearity	<=0.3%
Displacement sensors
Sensors type	Capacitance
Measuring principle	Time-to-digital convertion
Sample positioning
Sample coarse positioning range, mm	5x5
Positioning	Micro screws
Positioning accuracy, mcm	approx. 5

Click on the pictures below to see magnified drawings:

Contact us for more detailed information!

Download CERTUS OPTICS Datasheet

Download complete SPM Catalog

VECOR 101 Duranzo Aisle, Irvine, CA92606, USA
Phone: +1-949-394-4466, Fax: +1-949-451-6813, info@vecorus.com