CERTUS STANDARD^TM - Basic Configuration of Scanning Probe Microscope

	CERTUS STANDARDTM - basic configuration of scanning probe microscope, designed to solve a wide range of research and analytical tasks. CERTUS STANDARDTM includes: Scanning head CERTUSTM; Video microscope with USB camera; Integrated mechanical XY-stage for sample adjustment; Digital SPM controller EG-300TM; NSpecTM software package; Head approach system with one motorized actuator.
CERTUS STANDARDTM features: Implementation of all bascic SPM techniques: Atomic Force Microscopy (AFM, contact, and non-contact), shear force AFM, force spectroscopy, Scanning Tunneling Microscopy (STM), etc.; Plane-parallel scanning (in X-Y plane) allows imaging with minimal distortion; Parallel head approach system; Open design of scanning head simplifies observation of a sample and probe at any angle from 0o to 90o; CERTUS STANDARDTM is suitable for installation on optical microscope (upright or inverted) and can also be modified to CERTUS OPTICSTM, and CENTAURTM.

CERTUS STANDARD^TM is the best choice for everyday laboratory SPM measurements. CERTUS STANDARD^TM could also be interesting to researchers planning to integrate scanning probe microscope with optical and spectral equipment.

Latex spheres. Image was obtained with SPM CERTUS STANDARDTM. Semi-contact mode. Average spheres diameter is 94 nm. Image size 1 mcm x 1 mcm; 300 x 300 points. Topography. More detailed information is on Latex Spheres page.

SPM head CERTUSTM contains several probe holders: for standard cantilevers, for "tuning fork" type SPM probes with horizontal and vertical orientation, for STM tips. Any custom design tip holders may be developed by our R&D team by customer request. One has to change tip holder to change SPM mode. It is convenient to have several tip holders for use SPM head in cleaned areas, boxes. In this case, only tip holders are being transferred though transition chambers and hatches. You don’t need to move head (SPM microscope).

The Si/SiO2 periodic structure. Image was obtained with video microscope of SPM CERTUS STANDARDTM.	The Si/SiO2 periodic structure and probe. Image was obtained with video microscope of SPM CERTUS STANDARDTM. NSpec window.
The Si/SiO2 periodic structure and probe. Image was obtained with video microscope of SPM CERTUS STANDARDTM.	The Si/SiO2 periodic structure. Image was obtained with SPM CERTUS STANDARDTM. Semi-contact mode. Image size 30 mcm x 30 mcm; 600 x 600 points. Topography 3D. More detailed information is on Latex Spheres page.

Unique "open design" allows you use extremal large aperture objectives, illuminators, microscope condensers, etc. to illuminate the work area, monitor the sample and the probe position, take stock of radiation in the point of probe and sample contact.

SPECIFICATIONS

SPM Head
Built-in XYZ scanner
Scanning/positioning XYZ range, mcm	100x100x15
XY stage resonant frequency, kHz	1
Z resonant frequency, kHz	7
SPM resolution (XY lateral), nm	<1
SPM resolution (Z vertical), nm	<0.1
Residual non-linearity	0.3%
Displacement sensors
Sensors type	Capacitance
Measuring principle	Time-to-digital convertion
Scanning head approach system
Minimum step, mcm	1
Coarse approach implementation	3 stepper motors
Sample positioning
Sample coarse positioning range, mm	5x5
Positioning	Micro screws
Positioning accuracy, mcm	approx. 5

Optical Microscope
Visualization	Digital video microscope
Magnification adjustment	Manual
Fine adjustment range, mm	5
Image visualization	Color digital video camera
Illumination	Fiber illuminator
Optical parameters
Numerical aperture	0.3
Camera sensor size, inches	1/3
Camera sensor resolution, px	1280x1024
Magnification	85x/1050x
View field, mm	4.50/0.37
Interface	USB

Contact us for more detailed information!

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VECOR 101 Duranzo Aisle, Irvine, CA92606, USA
Phone: +1-949-394-4466, Fax: +1-949-451-6813, info@vecorus.com